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Verigy

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Q-Star Test Products are fully Supported by Verigys Ocelot & Personal Ocelot yielding:

  • High speed, high quality IDDQ test capabilities
  • Seamless hardware integration
  • Validation of advanced IDDQ test approaches and DSM test strategies
  • Fast debugging/validation of IDDQ vector sets
  • Supporting True IDDQ test methodologies
  • Test time reduction – Quality improvement

Verigy Personal Ocelot with QD-1011 module on loadboard

Formerly being products of Inovys, now being part of the Inovys DfX Solutions group of Verigy, the Ocelot and Personal Ocelot test platforms and related software technologies provide low cost methods for testing, bridging the gap between electronic design automation (EDA) and test, enabling reduced debug time and yield acceleration for semiconductor design and production. Inovys was founded in 1999 to develop practical, economic, and scalable solutions for the semiconductor industrys move to DFT and was acquired by Verigy in 2008. Verigys Ocelot and Personal Ocelot platform support Q-Stars QD-1011 and QD-1011HC products in a plug and play fashion.

Q-Stars products are also easily supported by Verigys 93000 system, thereby making use of its multi-port operating system.

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Testimonials

ST-Microelectronics

Compared with the traditional approach we can reach a very good coverage, get more information, have a better precision in electrical measures together with a reduction of 10 times in the test time when using the Q-Star Test solution.
-- Luca Buratti, ST-Microelectronics

Sharp Microelectronics USA

A die-to-die & test set-up independent DSM strategy based on Current Ratios was developed & successfully implemented in a production environment, furthermore the production quality was improved significantly. This was made possible only through the use of an advanced Q-Star Test IDDQ monitor.
-- Richard Ackerman, Senior Test Engineer, SMA

Freescale Semiconductor

Making use of Q-Star Tests QD-1020 product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality.
-- David Prystasz, Product Engineering Test team leader, Freescale Semiconducor

ROOD Technology

Making use of Q-Star Tests QD-1010Lite product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality.
-- Dieter Schreiber, Marketing & Sales Manager, Rood Technology

Dialog Semiconductor

Making use of Q-Star Tests QD-1011 product allows us to reduce test costs significantly compared to conventional IDDQ testing, whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality.
-- Markus Schmid, Manager Test Engineering Group, Dialog Semiconductor

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QT-1411 Datasheet
QD-1430HC Datasheet
QD-1411HC Datasheet
QD-1330HC Datasheet
QD-1311HC Datasheet
QD-1030HC Datasheet
QD-1023HC Datasheet
QD-1020HC Datasheet
QD-1013HC Datasheet
QD-1011HC Datasheet
QD-1430 Datasheet
QD-1411 Datasheet
QD-1330 Datasheet
QD-1311 Datasheet
QD-1040 Datasheet
QD-1030 Datasheet
QD-1023 Datasheet
QD-1020 Datasheet
QD-1013 Datasheet
QD-1011 Datasheet
QH-1011Lite Datasheet
QH-1011HCLite Datasheet
QD-1411HCLite: Quad Channel Datasheet
QD-1311HCLite: Dual/Triple Channel Datasheet
QD-1011HCLite: Single Channel Datasheet
QD-1411Lite: Quad channel Datasheet
QD-1311Lite: Dual/Triple Channel Datasheet
QD-1011Lite: Single Channel Datasheet
QA-1000 Datasheet