Originally founded in 1999 as Q-Star Test, Ridgetop Europe is a Belgium based global leader in advanced and innovative high-speed, high-performance current test and measurement solutions, and electronic prognostic and health management solutions.
With its unmatched Q-Star Test product line, Ridgetop Europe offers IDDx and ISSx measurement instruments supporting cost-effective applications of true IDDQ, delta-IDDQ, advanced IDDQ, IDDT, and analog IDD test strategies to digital, analog, and mixed-signal circuits in characterization, failure analysis and production test environments, leading to yielding yield improvements, cost reduction and product quality enhancement.
The Q-Star Test small-sized instruments are ATE-independent and outperform ATE-related IDD test hardware by improving measurement speed by a factor of at least 100, and offer a more than 10x improvement in test data quality when measurement resolution and repeatability is of concern.
Mr. Tom Heiser
Chairman of the Board
Mr. Heiser is the President and CEO of Ridgetop Group, the parent company of Ridgetop Europe nv. He has more than 35 years of experience in the electronics industry, having spent 30+ years at Hitachi in various executive roles. Most recently Mr. Heiser led Hitachi High Technologies Systems Products Division and business development group. He has led global sales, manufacturing, and business development initiatives inside of Hitachi.
Mr. Heiser holds a Bachelor of Science and Economics degree from Rockford University, IL.
Dr. Hans Manhaeve
Chief Executive Officer
Dr. Hans Manhaeve is the founder of Q-Star Test and has significant experience in the semiconductor industry providing unique, cost-effective, highly reliable solutions for IC and electronic circuits and systems testing to global semiconductor companies. His range of expertise includes: IC design and test, test strategy development and improvement, design for test methodologies (SCAN, BIST, and Boundary Scan) and application, fault models, fault grading, test vector generation, ATPG, digital/mixed-signal circuit testing, memory testing, (supply) current-based testing, (supply) current-based design for testing, Iddx monitor design and development for on-chip and off-chip applications, Iddq, Iddt, Iddx, BICS, Iddx application strategies, reliability screens, quality screening, and 0ppm support.
Dr. Manhaeve holds a PhD in Electonics Engineering from University of Hull, UK and has authored/co-authored more than 100 papers, half of which focus on current monitors and current-based test strategies. He holds fifteen patents focusing on high resolution current monitoring and fault detection methods in ICs and electronic circuits.