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Innovating Test and Characterization

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  • Q-Star Products
    • Basic Current Measurement
    • Advanced Current Measurement
    • Test & Measurement Platform
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About

History

Originally founded in 1999 as Q-Star Test, Ridgetop Europe is a Belgium based global leader in advanced and innovative high-speed, high-performance current test and measurement solutions, and electronic prognostic and health management solutions.

With its unmatched Q-Star Test product line, Ridgetop Europe offers IDDx and ISSx measurement instruments supporting cost-effective applications of true IDDQ, delta-IDDQ, advanced IDDQ, IDDT, and analog IDD test strategies to digital, analog, and mixed-signal circuits in characterization, failure analysis and production test environments, leading to yielding yield improvements, cost reduction and product quality enhancement.

The Q-Star Test small-sized instruments are ATE-independent and outperform ATE-related IDD test hardware by improving measurement speed by a factor of at least 100, and offer a more than 10x improvement in test data quality when measurement resolution and repeatability is of concern.

Management Team


Hans Manhaeve

Dr. Hans Manhaeve
Chief Executive Officer

Dr. Hans Manhaeve is the founder of Q-Star Test and has significant experience in the semiconductor industry providing unique, cost-effective, highly reliable solutions for IC and electronic circuits and systems testing to global semiconductor companies.  His range of expertise includes: IC design and test, test strategy development and improvement, design for test methodologies (SCAN, BIST, and Boundary Scan) and application, fault models, fault grading, test vector generation, ATPG, digital/mixed-signal circuit testing, memory testing, (supply) current-based testing, (supply) current-based design for testing, Iddx monitor design and development for on-chip and off-chip applications, Iddq, Iddt, Iddx, BICS, Iddx application strategies, reliability screens, quality screening, and 0ppm support.

Dr. Manhaeve holds a PhD in Electonics Engineering from University of Hull, UK and has authored/co-authored more than 100 papers, half of which focus on current monitors and current-based test strategies. He holds fifteen patents focusing on high resolution current monitoring and fault detection methods in ICs and electronic circuits.

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Consulting & Training

  • Design for test (DFT) methodologies and implementation. Test strategy improvement.
  • Hardware - software co-design and the aspect of Test and Design for Test
  • Supply-current-based DFT methodologies and techniques.
  • Supply-current test application and measurement strategies.
  • Achieving 0ppm Quality and Reliability.
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QT-1411 Datasheet
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QD-1430HC Datasheet
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QD-1411HC Datasheet
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QD-1330HC Datasheet
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QD-1311HC Datasheet
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QD-1030HC Datasheet
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QD-1023HC Datasheet
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QD-1020HC Datasheet
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QD-1013HC Datasheet
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QD-1011HC Datasheet
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QD-1430 Datasheet
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