Originally founded in 1999 as Q-Star Test, Ridgetop Europe is a Belgium based global leader in advanced and innovative high-speed, high-performance current test and measurement solutions, and electronic prognostic and health management solutions.
With its unmatched Q-Star Test product line, Ridgetop Europe offers IDDx and ISSx measurement instruments supporting cost-effective applications of true IDDQ, delta-IDDQ, advanced IDDQ, IDDT, and analog IDD test strategies to digital, analog, and mixed-signal circuits in characterization, failure analysis and production test environments, leading to yielding yield improvements, cost reduction and product quality enhancement.
The Q-Star Test small-sized instruments are ATE-independent and outperform ATE-related IDD test hardware by improving measurement speed by a factor of at least 100, and offer a more than 10x improvement in test data quality when measurement resolution and repeatability is of concern.
Dr. Hans Manhaeve
Chief Executive Officer
Dr. Hans Manhaeve is the founder of Q-Star Test and has significant experience in the semiconductor industry providing unique, cost-effective, highly reliable solutions for IC and electronic circuits and systems testing to global semiconductor companies. His range of expertise includes: IC design and test, test strategy development and improvement, design for test methodologies (SCAN, BIST, and Boundary Scan) and application, fault models, fault grading, test vector generation, ATPG, digital/mixed-signal circuit testing, memory testing, (supply) current-based testing, (supply) current-based design for testing, Iddx monitor design and development for on-chip and off-chip applications, Iddq, Iddt, Iddx, BICS, Iddx application strategies, reliability screens, quality screening, and 0ppm support.
Dr. Manhaeve holds a PhD in Electonics Engineering from University of Hull, UK and has authored/co-authored more than 100 papers, half of which focus on current monitors and current-based test strategies. He holds fifteen patents focusing on high resolution current monitoring and fault detection methods in ICs and electronic circuits.