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Sharp USA

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Motivation:

  • Defective devices deviate from normal distribution and Increased variance causes the bell curve to be distorted.
  • Using a single limit results in a loss of quality or a reduction in yield.
  • To overcome this the data of each individual die needs to be looked at
  • Explore the advantages of real time advanced measurement strategies:
    • Lot-to-lot / die-to-die dispersion independence decision making
    • ATE set-up dispersion independence
  • Explore the advantages of real time data processing features and evaluate the applicability of advanced real time screening algorithms in production test with a focus on:
    • Ability to on-the-fly recalculate decision limits
    • Adaptive limit setting
    • Test program independent limit setting

Project Objectives:

  • Development of a die-to-die dispersion independent DSM Test Strategy based on the Current Ratios IDDQ methodology
  • Evaluate DSM IDDQ application within production test constraints
  • Development and realization of Setup and subcontractor independent test programs

Module and Test platform

  • QD-1011 Advanced IDDQ measurement module>
    • High speed IDDQ measurement architecture (100µs)
    • On-board data processor memory (SRAM & EEPROM)
    • Custom Firmware for Current Ratios IDDQ support
    • Limits are calculated by the module based on first measurement and on base of 5 Parameters that are programmed into device EEPROM after product characterization, being Spec Limit, Upper Limit Slope, Upper Limit Intercept, Lower Limit Slope, Lower Limit Intercept
  • Various test platforms

The Recipe:

  • Use ATPG to generate 1000 IDDQ Vectors
  • Collect IDDQ data for one device
  • Build a histogram and verify Normal Distribution
  • Perform Temperature analysis on one device from 0C to 100C to validate IDDQ vector quality
  • Characterize split lot material
  • Extract equations for Max and o in terms of Min
  • Set Upper and lower limits
  • Program the IDD modules by loading the parameters for the Current Ratios monitor firmware
  • Run test on 100 devices to ensure that the modules are correctly programmed
  • Send modules and test program to Production test facility

Test Vehicles:

  • The strategy was validated using 2 devices running in production.

Conclusion:

A die-to-die and test set-up independent DSM strategy based on Current Ratios was developed & successfully implemented in a production test environment. SMA experienced a significant improvement of the production quality, test subcontractor independence and a reduction of the overall test time. These achievements were only made possible through the use of an advanced IDDQ measurement module.

References:

  • Ackerman R. , Doing More with Less: A Recipe for Rapid IDDQ Development, Digest of papers of the 9th IEEE European Test Symposium ETS2004, pp. , 273-278, May 2004, Ajaccio, Corsica, France.

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Testimonials

ST-Microelectronics

Compared with the traditional approach we can reach a very good coverage, get more information, have a better precision in electrical measures together with a reduction of 10 times in the test time when using the Q-Star Test solution.
-- Luca Buratti, ST-Microelectronics

Sharp Microelectronics USA

A die-to-die & test set-up independent DSM strategy based on Current Ratios was developed & successfully implemented in a production environment, furthermore the production quality was improved significantly. This was made possible only through the use of an advanced Q-Star Test IDDQ monitor.
-- Richard Ackerman, Senior Test Engineer, SMA

Freescale Semiconductor

Making use of Q-Star Tests QD-1020 product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality.
-- David Prystasz, Product Engineering Test team leader, Freescale Semiconducor

ROOD Technology

Making use of Q-Star Tests QD-1010Lite product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality.
-- Dieter Schreiber, Marketing & Sales Manager, Rood Technology

Dialog Semiconductor

Making use of Q-Star Tests QD-1011 product allows us to reduce test costs significantly compared to conventional IDDQ testing, whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality.
-- Markus Schmid, Manager Test Engineering Group, Dialog Semiconductor

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